Burn-In Test Chamber

WEIBER Burn in Chamber are engineered specifically for applications such as high dissipation forward bias, high-temperature reverse bias, dynamic and static burn-in of IC, RAM, ROM, microprocessors and other semiconductor devices. Burn in Oven are designed for dynamic and static burn-in of integrated circuits and other electronic devices, including laser diodes. This chamber also known as Burn in Test Chamber and Semi Conductor Burn in Oven.